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Model Number Information for Silicon Dioxide Film Thickness
Film Thickness Standards are used to calibrate optical film thickness measurement instruments such as ellipsometers, reflectometers and spectrophotometers. The certified measurand is derived film thickness for fixed index of refraction 1.46 using a single layer, transparent, homogenous calculation model. Silicon Dioxide Film Thickness Standards are traceable to SI units through NIST and NVLAP accredited under NVLAP Lab Code 200303-0.